THE ULTRA STRUCTURE OF INSECT SURFACES BY SCANNING ELECTRON MICROSCOPY

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Abstract
A recent development in microscopy certain to be of great interest to entomologists is the Scanning Electron Microscope. This machine overcomes the difficulties of studying solid surfaces with a standard light microscope and the problems of the extremely small limits of penetration of the electron microscope. This new microscope focuses a stream of electrons into a beam as small as 1 μ in diameter which moves over the surface of the specimen in a regular pattern, causing secondary radiations to emerge from the surface of the specimen. These are collected by a very sensitive detector and converted to an image similar to that produced by a television tube.

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