Magnetoresistance of Co/Pd and Co/Pt multilayer films for magneto-optical data storage applications

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Abstract
A study of the galvanomagnetic, magnetic, and magneto-optical properties of multilayered Co/Pd and Co/Pt films is presented. The samples are of different Co content with fixed thickness for the evaporated Co/Pt series and different thickness with fixed composition for the sputtered Co/Pd series. The magnetic and electronic properties of these films are correlated with the magnetoresistance measurements performed with fields applied parallel and perpendicular to the plane of the samples. The s-d scattering observed when the magnetization is aligned with the applied magnetic field is interpreted in terms of the electronic band structure of the materials.