A review on depth profiling of hydrogen and helium isotopes within the near-surface region of solids by use of ion beams
- 1 November 1978
- journal article
- review article
- Published by Elsevier in Journal of Nuclear Materials
- Vol. 78 (1) , 161-181
- https://doi.org/10.1016/0022-3115(78)90515-9
Abstract
No abstract availableKeywords
This publication has 27 references indexed in Scilit:
- Large depth profile measurements of D, 3He, and 6Li by deuteron induced nuclear reactionsNuclear Instruments and Methods, 1977
- Two Methods Using Ion Beams for Detecting and Depth Profiling Light Impurities in MaterialsPublished by American Chemical Society (ACS) ,1976
- Range profiles of 6–16-keV hydrogen ions implanted in metal oxidesJournal of Applied Physics, 1976
- Implantation profiles of low-energy helium in niobium and the blistering mechanismApplied Physics Letters, 1975
- Tritium depth profiling by neutron time−of−flightJournal of Vacuum Science and Technology, 1975
- Depth distribution profiling of deuterium and 3HeJournal of Nuclear Materials, 1974
- A NEW utilization of11B ion beams: Hydrogen analysis by1H11B,α)α α nuclear reactionRadiation Effects, 1974
- Use of the nuclear reaction 16O(d,α)14N in the microanalysis of oxide surface layersNuclear Instruments and Methods, 1973
- Principles and applications of ion beam techniques for the analysis of solids and thin filmsThin Solid Films, 1973
- Use of the Nuclear Reaction O16(d, p)O17 to Study Oxygen Diffusion in Solids and its Application to ZirconiumJournal of Applied Physics, 1968