"Hump" current dependence upon trapping effects and the relationship to some aspects of the forward-injection failure of GaAs tunnel diodes
- 1 September 1961
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IRE Transactions on Electron Devices
- Vol. 8 (5) , 427-428
- https://doi.org/10.1109/t-ed.1961.14846