Chemistry of grain boundaries in calcia doped silicon nitride studied by spatially resolved electron energy-loss spectroscopy
- 31 October 1994
- journal article
- Published by Elsevier in Analytica Chimica Acta
- Vol. 297 (1-2) , 97-108
- https://doi.org/10.1016/0003-2670(94)00058-1
Abstract
No abstract availableKeywords
This publication has 21 references indexed in Scilit:
- Quantitative Comparison of TEM Techniques for Determining Amorphous Intergranular Film ThicknessJournal of the American Ceramic Society, 1993
- Transmission electron microscopy characterization of a ceria-fluxed silicon nitrideJournal of Materials Science Letters, 1993
- SiC and Si3N4 materials with improved fracture resistanceJournal of the European Ceramic Society, 1992
- Analytical Electron Microscopy And High-Resolution Electron Microscopy Studies Of Grain-Boundary Films In Silicon Nitride-Based CeramicsMRS Proceedings, 1991
- On the Equilibrium Thickness of Intergranular Glass Phases in Ceramic MaterialsJournal of the American Ceramic Society, 1987
- Creep in polycrystalline aggregates by matter transport through a liquid phaseJournal of Geophysical Research, 1982
- The Intergranular Phase in Hot‐Pressed Silicon Nitride: I, Elemental CompositionJournal of the American Ceramic Society, 1981
- The Role of Grain‐Boundary Sliding in Fracture of Hot‐Pressed Si3N4 at High TemperaturesJournal of the American Ceramic Society, 1980
- On the detection of thin intergranular films by electron microscopyUltramicroscopy, 1979
- Imaging of thin intergranular phases by high-resolution electron microscopyJournal of Applied Physics, 1979