Easily Testable Cellular Realizations for the (Exactly P)-out-of n and (p or More)-out-of n Logic Functions

1 January 1974

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers

Vol. C-23 (1) , 98-100
https://doi.org/10.1109/T-C.1974.223787

Abstract

Networks to realize all n-variable symmetric threshold functions and elementary symmetric functions are given. It is also shown that only 2n test inputs are necessary and sufficient to test any number of faults in these networks.

Keywords

FUNCTIONS
THRESHOLD
FAULTS
LOGIC
ELEMENTARY
INPUTS
SUFFICIENT
TESTABLE
EXACTLY