OVERWRITE PROCESS CONTROL IN EXCHANGE COUPLED TRILAYER MO MEDIA BY NdFeCo CONTROL LAYER

Publisher Website
Google Scholar
Abstract
The relation between the overwrite characteristics and Kerr hysteresis loops for the exchange coupled trilayer (ECTL) media with various NdFeCo control layer thicknesses have been clarified. The ECTL media are of an antiparallel exchange coupling type with a TM-rich TbFe memory layer, a NdFeCo control layer and a RE-rich GdTbFeCo complementary layer. Overwrite is achieved for the ECTL media with the 3.0∼6.0nm NdFeCo control layer. When the NdFeCo layer thickness is less than 3.0nm, complementary layer initialization cannot be achieved, and when it is more than 6.0nm, magnetization direction copying from the complementary layer to the memory layer at about 125°C does not occur. It has been found that the overwrite process could be completely monitored with the Kerr hysteresis loops.

This publication has 1 reference indexed in Scilit: