Yield and angular distribution of cesium sputtered copper using a radioactive tracer technique.
- 1 May 1966
- journal article
- Published by American Institute of Aeronautics and Astronautics (AIAA) in AIAA Journal
- Vol. 4 (5) , 916-920
- https://doi.org/10.2514/3.3567
Abstract
No abstract availableKeywords
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