Error suppression in cavity perturbation measurements
- 1 October 1979
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 12 (10) , 989-995
- https://doi.org/10.1088/0022-3735/12/10/024
Abstract
A new technique is described which eliminates the influence of a non-ideal microwave circuit on cavity perturbation measurements. The technique is illustrated by measurements in the particularly difficult case of low-loss samples exhibiting large shifts in resonance frequency. Results for long cylindrical samples of resistance alloys are in agreement with the theory for needle-like spheroids as fas as frequency shifts are concerned.Keywords
This publication has 4 references indexed in Scilit:
- Microwave cavity-perturbation equations in the skin-depth regimeJournal of Applied Physics, 1977
- Electric susceptibility and d.c. conductivity of crystalline TTFTCNQSolid State Communications, 1976
- High-resolution thermal-expansion measurements of tetrathiafulvalenetetracyanoquinodimethane (TTF-TCNQ)Physical Review B, 1975
- Theory of microwave losses of one-dimensional conductors in the skin effect regime: Application of TTF-TCNQSolid State Communications, 1975