Space Efficient Algorithms for VLSI Artwork Analysis

Abstract
We present algorithms for performing connectivity analysis, transistor identification, and boolean geometric operations with region numbering. Previous methods all require O(n) space where n is the number of edges in the circuit artwork; our method takes only O(√n) space and can therefore handle circuits of any foreseeable size. Our algorithms are based on traditional scanline techniques in such a way that any implementation of our method will be at least as fast, as well as more compact. Statistics on one such implementation are presented.

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