Challenge to precise magnetic Compton-profile measurements (invited)
- 1 July 1989
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 60 (7) , 1666-1670
- https://doi.org/10.1063/1.1141054
Abstract
Recent developments of the insertion devices have made it possible to utilize intense hard x rays for precise Compton‐profile measurements. A Compton profile of Si (110), which is measured using 29.5‐keV synchrotron‐radiation x rays, is shown as an example of a precise measurement having a momentum resolution of 0.084 a.u., the best resolution ever achieved. A promising plan is presented on magnetic electron Compton‐profile measurements using circularly polarized 60‐keV x rays from a newly developed multipole wiggler in the 6‐GeV accumulation ring at KEK as an elliptically polarized source.Keywords
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