Observation of surface reconstruction on silicon above 800 °C using the STM
- 1 May 1991
- journal article
- Published by Springer Nature in Nature
- Vol. 351 (6323) , 215-217
- https://doi.org/10.1038/351215a0
Abstract
No abstract availableKeywords
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- Some New Techniques in Reflection High Energy Electron Diffraction (RHEED) Application to Surface Structure StudiesJapanese Journal of Applied Physics, 1977