Thickness and Refractive Index Measurement of a Lamina with a Michelson Interferometer*
- 1 April 1966
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 56 (4) , 451
- https://doi.org/10.1364/josa.56.000451
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 1 reference indexed in Scilit:
- A Method of Determining Concurrently the Thickness and Refractive Index of a Thin Film or LaminaJournal of the Optical Society of America, 1950