Normal photoelectron diffraction studies of selenium and sulfur overlayers on Ni(011) and Ni(111)
- 15 August 1982
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 26 (4) , 1812-1818
- https://doi.org/10.1103/physrevb.26.1812
Abstract
Normal photoelectron diffraction was used to determine the structure of S and Se on Ni(011) and of four different overlayers of Se on Ni(111). For Se on Ni(011), Se bonds in the hollow site, whereas for S on Ni(011), it is difficult to choose between the hollow and the top sites. For both a low coverage, disordered Se overlayer and an annealed Se overlayer on Ni(111), Se was found to be situated in those threefold hollow sites which have a vacancy below them in the second layer. In the case of an unannealed Se overlayer on Ni(111), the Se is adsorbed in approximately equal amounts in the top and hollow sites.
Keywords
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