Charge dynamics and time evolution of contact potential studied by atomic force microscopy
- 15 December 1997
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 56 (23) , 15391-15395
- https://doi.org/10.1103/physrevb.56.15391
Abstract
We experimentally exhibit a time evolution of the contact potential measured between an atomic force microscopy (AFM) tip and a metallic surface. To understand this effect, we propose a simple model involving migration of charged contaminants located on the surface. These results show that AFM used in the resonant mode can be used to study diffusion and surface transport phenomena.Keywords
This publication has 7 references indexed in Scilit:
- Electrostatic forces between a metallic tip and semiconductor surfacesJournal de Physique I, 1994
- Surface investigations with a Kelvin probe force microscopeUltramicroscopy, 1992
- High resolution atomic force microscopy potentiometryJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1991
- Manipulation of Adsorbed Atoms and Creation of New Structures on Room-Temperature Surfaces with a Scanning Tunneling MicroscopeScience, 1991
- High-resolution capacitance measurement and potentiometry by force microscopyApplied Physics Letters, 1988
- Ion Transport Phenomena in Insulating FilmsJournal of Applied Physics, 1965
- Mobile electric charges on insulating oxides with application to oxide covered silicon p-n junctionsSurface Science, 1964