Abstract
SAR interferometry requires a thorough phase control through- out the imaging process. The phaseaccuracy is affected bydecor- relation effects between the individual surveys. The paper pres- ents the probability density function of the interferometric phase and analyzes quantitatively the influence of decorrelation. In panicular, phase aberrations typical for SAR processors are stu- died. The dependence of phase bias and variance on processor parameters is demonstrated.

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