Organic secondary ion mass spectrometry (SIMS) and its relation to Fast Atom Bombardment (FAB)
- 1 January 1983
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Physics
- Vol. 46, 459-462
- https://doi.org/10.1016/0020-7381(83)80151-x
Abstract
No abstract availableKeywords
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