Determination of the thickness and optical constants of thin films from transmission spectra
- 30 September 1996
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 286 (1-2) , 164-169
- https://doi.org/10.1016/s0040-6090(96)08737-8
Abstract
No abstract availableKeywords
This publication has 15 references indexed in Scilit:
- Elimination of interference effects from photoinduced-transmission decay curves of thin silicon filmsApplied Optics, 1995
- Simple method for optical parameter determination of inhomogeneous thin filmsThin Solid Films, 1993
- Interference effects in pump-probe spectroscopy of thin filmsJournal of Applied Physics, 1993
- A comparison of methods for the determination of optical constants of thin filmsThin Solid Films, 1992
- Femtosecond spectroscopy of hot carrier relaxation in bulk semiconductorsSemiconductor Science and Technology, 1992
- Picosecond transient optical phenomena in a-Si:HCritical Reviews in Solid State and Materials Sciences, 1990
- Influence of interference on photoinduced changes in transmission and reflectionOptics Communications, 1986
- Determination of the thickness and optical constants of amorphous siliconJournal of Physics E: Scientific Instruments, 1983
- Determination of the optical constants and thickness of amorphous V2O5 thin filmsThin Solid Films, 1983
- A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin filmJournal of Physics E: Scientific Instruments, 1976