An unconventional multi-purpose diffractometer for synchrotron X-rays at DORIS
- 1 April 1982
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 195 (1-2) , 363-366
- https://doi.org/10.1016/0029-554x(82)90800-x
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- X-ray measurement of minute lattice strain in perfect silicon crystalsZeitschrift für Kristallographie - Crystalline Materials, 1981
- Phase-angle determination by anomalous X-ray scattering with a four-circle SSD diffractometerActa Crystallographica Section A, 1980
- Zur röntgenographischen Bestimmung des Typs einzelner Versetzungen in EinkristallenThe European Physical Journal A, 1958
- Notizen: Röntgenographische Abbildung des Verzerrungsfeldes einzelner Versetzungen in Germanium-EinkristallenZeitschrift für Naturforschung A, 1958