Three-dimensional probe reconstruction for atomic force microscopy
- 1 July 1994
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 65 (7) , 2249-2251
- https://doi.org/10.1063/1.1144735
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- Envelope reconstruction of probe microscope imagesPublished by Elsevier ,2002
- Colloidal gold particles as an incompressible atomic force microscope imaging standard for assessing the compressibility of biomoleculesBiophysical Journal, 1993
- Tip-radius-induced artifacts in AFM images of protamine-complexed DNA fibersUltramicroscopy, 1992
- Atomic force and scanning tunneling microscopy observations of whisker crystals and surface modification on evaporated gold filmsUltramicroscopy, 1992
- Probe characterization for scanning probe metrologyUltramicroscopy, 1992
- Microfabrication of AFM tips using focused ion and electron beam techniquesUltramicroscopy, 1992
- Tip artifacts of microfabricated force sensors for atomic force microscopyApplied Physics Letters, 1992
- Characterization of scanning probe microscope tips for linewidth measurementJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1991
- Electromagnetic surface waves on a free-electron-like medium in the presence of a DC current: the dispersion relationSurface Science, 1991
- Atomic Force MicroscopePhysical Review Letters, 1986