New EPROM Data-Loss Mechanisms

• 1 April 1983
• proceedings article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in 8th Reliability Physics Symposium
• https://doi.org/10.1109/irps.1983.361969

Abstract

Keywords

• TEMPERATURE
• FAILURE MODE
• RELATIONAL DATA
• PRODUCTION SYSTEMS
• EPROM
• CONTAMINATION
• EXTRAPOLATION
• NONVOLATILE MEMORY
• THRESHOLD VOLTAGE
• TOPOLOGY