Analysis of Accelerated Life Test Data - Part I: The Arrhenius Model and Graphical Methods
- 1 December 1971
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electrical Insulation
- Vol. EI-6 (4) , 165-181
- https://doi.org/10.1109/tei.1971.299172
Abstract
This is Part I of a three-part series presenting statistical methods for planning and analyzing temperature-accelerated life tests when all test units are run to failure. These methods are presented so they can be profitably used by individuals with a limited statistical background. In Part I, the Arrhenius model is described, and graphical methods for analysis of such complete data are given. In Part II, numerical methods for analysis of such data are given, and optimum and standard test plans are presented and compared. In Part III, graphical and numerical methods for comparing different products are given, and methods for assessing the validity of the data and the assumptions of the Arrhenius model are also given. These methods are illustrated throughout with accelerated life test data on insulation. While the methods are presented here with the Arrhenius model, they can be used for planning and analyzing many other accelerated life test situations.Keywords
This publication has 4 references indexed in Scilit:
- Analysis of Accelerated Life Test Data-Part III: Product Comparisons and Checks on the Validity of the Model and DataIEEE Transactions on Electrical Insulation, 1972
- Bibliography on Thermal Aging of Electrical InsulationIEEE Transactions on Electrical Insulation, 1969
- A Supplement to Mendenhall's Bibliography on Life Testing and Related TopicsJournal of the American Statistical Association, 1964
- A BIBLIOGRAPHY ON LIFE TESTING AND RELATED TOPICSBiometrika, 1958