Comparison of Bitter Patterns and X-Ray Images of Domains in Fe–Si Crystals
- 15 March 1971
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 42 (4) , 1814-1816
- https://doi.org/10.1063/1.1660447
Abstract
Ferromagnetic domains as well as imperfections in the interior of Fe–Si single crystals are observed by the x‐ray topographic technique employing the anomalous transmission of x‐rays (Borrmann effect). X‐ray topographic images of domains are compared with the Bitter patterns obtained in the same region of a single crystal of Fe–3% Si. It is shown that when a suitable reflecting plane is used and the domain arrangement remains unchanged during the experiment, an exact correlation exists between the Bitter pattern and the x‐ray topograph.This publication has 6 references indexed in Scilit:
- Observations of Ferromagnetic Domains by Anomalous Transmission of X‐Rays. The Effects of Variation in the Reflecting PlanePhysica Status Solidi (b), 1967
- Anomalous Transmission of X‐Rays in Fe‐3 pct Si Crystals and the Observation of Ferromagnetic DomainsPhysica Status Solidi (b), 1965
- The Dynamical Theory of X-Ray DiffractionPublished by Elsevier ,1963
- X-RAY TOPOGRAPHIC STUDIES OF MAGNETIC DOMAIN CONFIGURATIONS AND MOVEMENTSApplied Physics Letters, 1962
- X-Ray Study of Ferromagnetic Domains in Cobalt Zinc FerriteJournal of Applied Physics, 1960
- The Magnetic Structure of Iron CrystalsPhysical Review B, 1942