Structural characterization of the (111) surfaces of CdZnTe and HgCdTe epilayers by x-ray photoelectron diffraction
- 1 May 1991
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 9 (3) , 1861-1869
- https://doi.org/10.1116/1.585813
Abstract
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