Device for microcreep experiments at high temperature
- 1 August 1977
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 10 (8) , 798-801
- https://doi.org/10.1088/0022-3735/10/8/015
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- A Photographic Method for High-Temperature Strain MeasurementsCanadian Metallurgical Quarterly, 1966
- The influence of phosphorus in dilute solid solution on the absolute surface and grain boundary energies of ironProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1965