Electronic and Structural Properties of a Twin Boundary in Si
- 5 May 1986
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 56 (18) , 1925-1928
- https://doi.org/10.1103/physrevlett.56.1925
Abstract
A second-order twin boundary in Si, of the type, is investigated with first-principles density-functional theory and with an empirical tight-binding model. Of two proposed reconstructions studied, the one supported by recent experiment is energetically favored, with less bond stretching than the other. A conduction-band-edge interface electronic state associated with bond-angle strains is found. A phonon resonance, the interfacial analog of a Rayleigh mode, is predicted; Raman spectroscopy should be able to detect it.
Keywords
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