Cavity Phase Shift Method For High Reflectance Measurements At Mid-Infrared Wavelengths

1 December 1982

journal article
Published by SPIE-Intl Soc Optical Eng in Optical Engineering

Vol. 21 (6) , 216979-216979-
https://doi.org/10.1117/12.7973018

Abstract

The cavity phase shift method can measure high reflectances on spherical surfaces with good spatial resolution. Successful demonstration at 2.9 micrometers wavelength is described. A reflectance of 0.9920±0.0050 has been measured.

Keywords

REFLECTIVITY
PHASE SHIFTING