Flux Reversal by Néel Wall Motion
- 1 April 1963
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 34 (4) , 1211-1212
- https://doi.org/10.1063/1.1729439
Abstract
Domain wall motion is expected to be the fundamental flux reversal mechanism for thin permalloy films in the low drive region HK. The velocity of a wall when a switching field H is applied is given by V=G(H‐H0), where G is the mobility and H0 is the starting field. For films with thicknesses on the order of few hundred angstroms, where Néel walls are expected, the mobility is limited by intrinsic damping to a value much smaller than would be expected if only eddy current damping were present. Calculations have been made using a value for the damping constant, α=.015, obtained from coherent rotation studies, and the experimental values for the thickness of the wall obtained by Fuchs in order to obtain G as a function of film thickness. The mobility was measured for seven permalloy films ranging from 128 to 495Å thick. The agreement between the calculations and experiment was within 30%, indicating that the value of α for a 100‐Å film is nearly the same as for thicker films.This publication has 4 references indexed in Scilit:
- Sensitive Flux Measurement of Thin Magnetic FilmsReview of Scientific Instruments, 1960
- Domain Wall Velocities in Thin Iron-Nickel FilmsJournal of Applied Physics, 1960
- Initial Susceptibility Spectra of Permalloy FilmsJournal of Applied Physics, 1960
- Domain Walls in Thin Ni-Fe FilmsIBM Journal of Research and Development, 1960