Thermal-annealing studies of defects in lithium fluoride after electron-beam irradiation
- 15 March 1991
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 43 (8) , 6723-6728
- https://doi.org/10.1103/physrevb.43.6723
Abstract
We have bombarded single-crystal LiF surfaces with 400-eV electrons at fixed target temperatures between 330 and 470 K and varied the irradiation time between 30 and 4200 sec. After irradiation we heated the crystals up to 750 K and simultaneously recorded the Li desorption. Interpreting the amount of desorbed Li atoms as a measure for frozen electron-center defects and Li agglomerates in the crystal, we were able to obtain an activation energy for the thermal migration of the H centers of about 0.13 eV. Investigations, where the bombarding time has been varied, indicate efficient H-center trapping processes and different lifetimes for H-center clusters of different sizes in the crystal. In addition, we found evidence for a substantial formation of F-center agglomerates under the surface and Li islands on the surface.Keywords
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