Stability of Sputter Deposited Al-Cu Bilayers on SiO2.
- 1 January 1992
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
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This publication has 2 references indexed in Scilit:
- Diffusion of Metals in Silicon DioxideJournal of the Electrochemical Society, 1986
- Nondestructive Evaluation of Semiconductor Materials and DevicesPublished by Springer Nature ,1979