Depth profiling of elements in surface layers of solids based on angular resolved X-ray photoelectron spectroscopy
- 1 September 1990
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 53 (1-2) , 1-18
- https://doi.org/10.1016/0368-2048(90)80337-a
Abstract
No abstract availableKeywords
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