Formation of titanium fulleride studied by x-ray spectroscopies
- 15 May 1999
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 59 (19) , 12667-12671
- https://doi.org/10.1103/physrevb.59.12667
Abstract
The chemical interaction between titanium and in coevaporated titanium-fulleride films has been investigated by x-ray photoelectron spectroscopy, (XPS), x-ray absorption spectroscopy (XAS), and x-ray emission spectroscopy. Two titanium-fulleride films with different Ti concentrations ( and 3.6) and a pure film were chosen in this study. C XPS analyses show a binding-energy shift and a line-broadening effect. C XAS study of shows a small change of the absorption resonance, with respect to its intensity and energy position, and a variation of the spectral shape in the absorption region in comparison with pure The C Kα x-ray emission spectra of the films show the same total emission bandwidth as pure For resonant and nonresonant excitations, an x-ray spectral profile similar to pure is observed from the film, while the film results in a spectral profile with some contribution from titanium carbide. All the experimental results indicate that a titanium-fulleride compound has been formed in the coevaporation process of and titanium.
Keywords
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