Thin-film infrared spectroscopic method for low-temperature vapor pressure measurements
- 1 January 1990
- journal article
- Published by American Chemical Society (ACS) in The Journal of Physical Chemistry
- Vol. 94 (1) , 440-442
- https://doi.org/10.1021/j100364a075
Abstract
No abstract availableKeywords
This publication has 0 references indexed in Scilit: