Fourier Transform Raman Spectroscopy Using a Bench-Top FT-IR Spectrometer
- 1 July 1988
- journal article
- research article
- Published by SAGE Publications in Applied Spectroscopy
- Vol. 42 (5) , 796-800
- https://doi.org/10.1366/0003702884428860
Abstract
Fourier transform Raman spectroscopy has been performed with an inexpensive bench-top FT-IR spectrometer optimized for the near-infrared. The laser excitation source was from a continuous-wave Nd: YAG laser with an output at 1.064 μm. Spectra from solid samples, ground as powders, have been obtained. Many of these are well known to fluoresce in the visible region and are thus intrinsically difficult to study by the Raman method. The FT-Raman method is described, and improvements in the technique are considered.Keywords
This publication has 8 references indexed in Scilit:
- Fourier transform Raman spectroscopyJournal of the American Chemical Society, 1986
- Interferometric Observation of Raman Spectra: Comparison of Photomultiplier and Avalanche Diode DetectorsApplied Spectroscopy, 1986
- Fluorescence rejection in Raman spectroscopy using a gated intensified diode array detectorJournal of Raman Spectroscopy, 1986
- Raman spectroscopyAnalytical Chemistry, 1986
- FT-Raman Spectroscopy: Development and JustificationApplied Spectroscopy, 1986
- Surface-enhanced resonance Raman spectroscopy of Rhodamine 6G adsorbed on colloidal silverThe Journal of Physical Chemistry, 1984
- Fluorescence-free resonance Raman spectra of reduced nicotinamide adenine dinucleotide via ultraviolet excitationJournal of Raman Spectroscopy, 1980
- New apodizing functions for Fourier spectrometryJournal of the Optical Society of America, 1976