X-ray topography settings: White beam topography and direct viewing detectors, two-axis spectrometer
- 1 June 1978
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 152 (1) , 313-317
- https://doi.org/10.1016/0029-554x(78)90286-0
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Crystal growth kinetics in (GaAs)n−(AlAs)m superlattices deposited by molecular beam epitaxyJournal of Crystal Growth, 1978
- Crystal assessment by x-ray topography using synchrotron radiationProgress in Crystal Growth and Characterization, 1977
- Cryogenic X-ray topography using synchrotron radiationJournal of Applied Crystallography, 1977
- Synchrotron radiation – its application to high-speed, high-resolution X-ray diffraction topographyJournal of Applied Crystallography, 1975
- Use of synchrotron radiation in X-ray diffraction topographyPhysica Status Solidi (a), 1974