Effect of Truncation of the Size Distribution of Extremely Fine Metal Particles

• 1 February 1980
• journal article
• Published by IOP Publishing in Japanese Journal of Applied Physics
• Vol. 19  (2) , 367-369
• https://doi.org/10.1143/jjap.19.367

Abstract

Keywords

• GEOMETRIC MEAN
• ELECTRON MICROSCOPE
• BIASED SAMPLING
• PARTICLE SIZE DISTRIBUTION