Stress—strength reliability models
- 1 January 1980
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 20 (4) , 513-516
- https://doi.org/10.1016/0026-2714(80)90599-5
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Reliability analysis of mechanical components and systemsNuclear Engineering and Design, 1972