First-order Markov process representation of binary radar data sequences
- 1 March 1957
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Information Theory
- Vol. 3 (1) , 56-64
- https://doi.org/10.1109/tit.1957.1057395
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- The frequency goodness of fit test for probability chainsMathematical Proceedings of the Cambridge Philosophical Society, 1951