Infrared electrodynamics from ellipsometric measurements
- 1 February 1996
- journal article
- Published by Taylor & Francis in Ferroelectrics
- Vol. 176 (1) , 221-238
- https://doi.org/10.1080/00150199608223612
Abstract
We discuss ellipsometric measurements with a Fourier-transform spectrometer. An optimization of the procedure is examined in detail, in particular, for strongly polar lattice bands in insulators and for free-carrier response of high-temperature superconductors. We report the response functions of SrTiO3 in the mid-infrared range, identify multiphonon processes, and explain the main features of one-phonon spectra.Keywords
This publication has 13 references indexed in Scilit:
- Transverse and longitudinal vibration modes in α-quartzPhilosophical Magazine Part B, 1994
- Far-infrared response of free carriers in YBA2Cu3O7 from ellipsometric measurementsPhysica C: Superconductivity and its Applications, 1994
- Complex refractive index of MgO in the far infrared from transmission and reflection measurementsInfrared Physics, 1992
- Infrared optical response of YBa2Cu3O7 and PrBa2Cu3O7 An ellipsometric studyPhysica C: Superconductivity and its Applications, 1992
- Infrared optical constants of intrinsic siliconPhysica Status Solidi (a), 1985
- Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 eVPhysical Review B, 1983
- Spectroscopic ellipsometry in the infraredInfrared Physics, 1981
- Precision Bounds to Ellipsometer SystemsApplied Optics, 1975
- Temperature Dependence of the Transverse and Longitudinal Optic Mode Frequencies and Charges in SrTiand BaTiPhysical Review B, 1966
- Far Infrared Dielectric Dispersion in BaTi, SrTi, and TiPhysical Review B, 1962