Abstract
A lithium niobate (LiNbO3) epitaxial film has been grown by magnetron RF sputtering. It was grown on a sapphire substrate with a predeposited and annealed LiNbO3 buffer layer. The effects of a buffer layer on growth-film properties were studied by physical analysis, including X-ray diffraction, reflection high-energy electron diffraction and scanning electron microscopy.

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