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Replica Technique for Systematic Examination of a Surface under the Electron Microscope
Home
Publications
Replica Technique for Systematic Examination of a Surface under the Electron Microscope
Replica Technique for Systematic Examination of a Surface under the Electron Microscope
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Florence Nesh
Florence Nesh
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1 October 1956
journal article
Published by
AIP Publishing
in
Journal of Applied Physics
Vol. 27
(10)
,
1252-1253
https://doi.org/10.1063/1.1722246
Abstract
No abstract available
Cited
Cited by 1 article
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