The nonlinear analog fault diagnosis scheme of Wu, Nakajima, Wey, and Saeks in the tableau context
- 1 September 1984
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems
- Vol. 31 (9) , 828-830
- https://doi.org/10.1109/tcs.1984.1085580