Field-ion microscopy of silicon
- 1 April 1975
- journal article
- other
- Published by Elsevier in Surface Science
- Vol. 49 (2) , 645-648
- https://doi.org/10.1016/0039-6028(75)90375-1
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Technique for the Preparation of Ge and Si Field-Emission CathodesReview of Scientific Instruments, 1972
- Field Emission from SiliconJournal of Applied Physics, 1958
- Surface Properties of GermaniumBell System Technical Journal, 1953
- Surface States and Rectification at a Metal Semi-Conductor ContactPhysical Review B, 1947