Background problem in electron-energy-loss spectroscopy
- 1 June 1993
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 47 (22) , 14734-14740
- https://doi.org/10.1103/physrevb.47.14734
Abstract
At large scattering angle the background formation in electron-energy-loss spectroscopy is determined by elastic-inelastic scattering events. The suitability of the usual background fitting is critically investigated as a function of specimen thickness, collection angle, and width of energy window.
Keywords
This publication has 22 references indexed in Scilit:
- Aperture effects and the multiple-scattering problem of fast electrons in electron-energy-loss spectroscopyPhysical Review B, 1992
- Plural-scattering deconvolution of electron energy-loss spectra recorded with an angle-limiting apertureUltramicroscopy, 1990
- Electron spectroscopic diffractionUltramicroscopy, 1990
- Calculation of the angular and energy distribution of multiple scattered electrons using fourier transformsUltramicroscopy, 1989
- A transport equation theory of beam spreading in the electron microscopeUltramicroscopy, 1983
- A new approach to the measurement of the momentum densities in solids using an electron microscopeChemical Physics Letters, 1981
- The microanalysis of light elements using transmitted energy loss electronsUltramicroscopy, 1975
- Thick specimens in the CEM and STEM. I. ContrastJournal of Applied Physics, 1974
- Inelastic Collisions of Fast Charged Particles with Atoms and Molecules—The Bethe Theory RevisitedReviews of Modern Physics, 1971
- Zum Energieverlust schneller Elektronen in d nnen SchichtenThe European Physical Journal A, 1950