Characterization of dark noise in CdZnTe spectrometers
- 1 June 1998
- journal article
- Published by Springer Nature in Journal of Electronic Materials
- Vol. 27 (6) , 807-812
- https://doi.org/10.1007/s11664-998-0057-8
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Statistical models for charge collection efficiency and variance in semiconductor spectrometersJournal of Applied Physics, 1997
- Study of contacts to CdZnTe radiation detectorsJournal of Electronic Materials, 1997
- Fabrication and characterization of CdZnTe radiation detectors with a new P-I-N designJournal of Electronic Materials, 1997
- New developments in CdTe and CdZnTe detectors for X and γ-ray applicationsJournal of Electronic Materials, 1997