Measurement of deep-level spatial distributions
- 1 April 1976
- journal article
- research article
- Published by Elsevier in Solid-State Electronics
- Vol. 19 (4) , 341-342
- https://doi.org/10.1016/0038-1101(76)90033-2
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Deep-level transient spectroscopy: A new method to characterize traps in semiconductorsJournal of Applied Physics, 1974
- Determination of deep levels in semiconductors from C-V measurementsIEEE Transactions on Electron Devices, 1972
- LOW-TEMPERATURE HIGH-FREQUENCY CAPACITANCE MEASUREMENTS OF DEEP-AND SHALLOW-LEVEL IMPURITY CENTER CONCENTRATIONSApplied Physics Letters, 1969