Applications of x-ray interferometry in metrology and phase-contrast imaging

• 29 July 2002
• proceedings article
• Published by SPIE-Intl Soc Optical Eng
• Vol. 4900, 257-268
• https://doi.org/10.1117/12.484565

Abstract

Keywords

• INTERFEROMETRY
• METROLOGY
• PHASE CONTRAST
• X-RAYS