Design of experiments approach to gradient estimation and its application to CMOS circuit stochastic optimization
- 1 January 1991
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 3098-3101 vol.5
- https://doi.org/10.1109/iscas.1991.176205
Abstract
A method using orthogonal array (OA)-based design of experiments is applied to screening and stochastic gradient evaluation for a generalized yield/Taguchi 'loss' function and a general CMOS statistical model. In comparison with the Taguchi approach, the method does not require 'inner' and 'outer' table combinations. The method is shown to be much more efficient than an equivalent Monte Carlo approach on a practical CMOS circuit design example.Keywords
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