A discussion of the usefulness of microanalysis using accelerators

This publication has 9 references indexed in Scilit:

• The use of the PIXE technique with nuclear microprobes
  Nuclear Instruments and Methods, 1981
• Quantitative aspects of ion scattering spectroscopy
  Surface and Interface Analysis, 1980
• Probing and imaging techniques for surface studies
  Materials Science and Engineering, 1980
• Modern methods for thin film and surface analyses
  Materials Science and Engineering, 1980
• Chemical characterization of industrial steel and aluminium sheet surfaces by secondary ion mass spectrometry, glow discharge optical spectroscopy and other surface-sensitive techniques
  Materials Science and Engineering, 1980
• Some aspects of Auger microanalysis
  Surface Science, 1979
• The production and use of a nuclear microprobe of ions at MeV energies
  Nuclear Instruments and Methods, 1979
• Analytical application of particle induced X-ray emission
  Nuclear Instruments and Methods, 1976
• Developments in secondary ion mass spectroscopy and applications to surface studies
  Surface Science, 1975