Neutron and X-ray Reflectometry: Solid Multilayers and Crumpling Films
- 1 January 1997
- journal article
- research article
- Published by CSIRO Publishing in Australian Journal of Physics
- Vol. 50 (2) , 391-405
- https://doi.org/10.1071/p96021
Abstract
The structures of films and interfaces at the molecular level can be determined from specular reflectivity measurements using neutrons and X-rays. A general introduction to the principles of neutron and X-ray reflectometry is given. Illustrative examples of the application of neutron and X-ray reflectometry to problems of chemical and physical interest are presented.Keywords
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